AN ADVANCED QUALITY CONTROL AND RESEARCH WORKSTATION FOR SILICON MATERIALS AT ALL PROCESS STAGES

LIS-R3

LIS-R3 is an upgrade version emerging from the LIS-R2 PLUS. It involves multiple software and hardware improvements resulting better user experience and provide more comprehensive optional functions. The LIS-R3 is a multi-functional luminescence imaging tool for silicon wafers, half-processed cells,finished cells and mini-modules, ideal for R&D laboratories or for sampling in production.

  • Proven reliability in 24/7 operation
  • CE marked
  • Capable of handling M12 samples
  • Proprietary and accurate algorithm
FunctionAs-cut WaferHalf-processed CellFinished CellMini-moduleThick Mono Slug
PL Imaging✔✔✔✔✔
EL Imaging and Rs ImagingOptionOption
QSS-PC and Calibrated LifetimeOption
IV, Suns-Voc CurvesOptionOption
Voc, Jmpp, J0 and Efficiency ImagesOptionOption
Front and Bulk Separation EstimationOptionOption
Muti-Si As-cut Wafer AnalysisOption
Mono-Si As-cut Wafer AnalysisOption
Thick Mono Slug AnalysisOption
Examples of PL Imaging and Series Resistance Imaging for different solar cells are displayed below. Please click the contact us button to request a full-function demo or make inquiries.