Quality Control Workstation for as-cut wafers, half-processed cells and finished cells

Qa-W3

PL imaging tool for quality control and sorting of as-cut wafers, half-processed cells and finished cells

  • Unmatched image quality
  • Defects reveal (circle strength, dark corner area and so on)
  • Enlarged field of view in the latest version
  • PL+ technology for finished cells
FunctionAs-cut WaferHalf-processed CellFinished Cell
PL Imaging✔✔✔
PL+ ImagingOption
Mono-Si As-cut Wafer AnalysisOption
Examples of PL Imaging for different samples are displayed below. Please click the contact us button to request a full-function demo or make inquiries.