PL imaging tool for quality control and sorting of as-cut wafers
Contactless inspection and quality sorting
Easy integration
High throughput
Proprietary algorithm
Enlarged field of view in the latest version
Sample types
Functions
As-cut Wafer
PL imaging
Analysis metrics for as-cut wafers
Examples of PL Imaging for different as-cut wafers are displayed below. Please click the contact us button to request a full-function demo or make inquiries.
